GIS Shapefile finding
Seeking shapefile of city boundaries in US?
What is a good KPI for software QA? How can you measure the efficiency of the QA team?   What KPIs would you set up? Migrated question's answers can be upvoted twice by the same user What's the difference between a projection and a datum? Accidentally moved directories under root What Lagrangian counterterms might be needed in a $\phi^ 6$ theory in 3D? Why am I getting no power when I pedal? Is the 2DS region locked? Will I be able to play NA games on a Japanese System? If I purchase a 2DS from Japan, will I be able to play American games on it? I have a circuit board in production, primarily through-hole, to the tune of ~400 units per year. Each one is manually inspected and tested. The board has ten distinct voltage rails, four voltage feedback amps, three current feedback amps, a microprocessor with particular response characteristics, and a few other parts. That's a lot to check.  I'm considering building an automated test rig for all that. I think a PCB that feeds the appropriate input stimuli, observes the responses, and gives a go/no-go would save me a lot of time. I'm reasonably confident that this is done, commonly. However, the techniques used to do it are unknown to me.  I imagine a test rig with a circuit board of the same footprint as the unit under test (UUT). It would have a microprocessor, appropriate protection and scaling circuitry, and a large number of vertical pins sticking up from the board. Mount points would also stick up from the test rig for the UUT. When the UUT is mounted on top of the test rig, the bottom of the board makes contact with the vertical pins, allowing the test rig to feed stimuli to the UUT and observe responses.  This seems reasonable, and I have the idea I've seen something very much like this before. But the details elude me. What sorts of pins would be used on the bottom board? (Part numbers would be great!) Would I need to put specific kinds of test points on the UUT, or can I get away with just contacting the clipped pins protruding through the board? What other concerns might there be? In PostgreSQL is the row ordering preserved in functions and CTEs? In SQL Server 2005, are there any disadvantages to making all character fields nvarchar(MAX) rather than specifying a length explicitly, e.g. nvarchar(255)? (Apart from the obvious one that you aren't able to limit the field length at the database level) Can somebody tell me why the counting measure (so, if $S=P(X)$, then $\mu(A)$=infinity if $A$ isn't finite and $\mu(A)=$#$A$ if $A$ is finite) is a measure? (The second property of a measure isn't clear for me). How can I stop applications and services from running? Do I need Intel Smart Response when installing Ubuntu? Don't you think people need to know what they did wrong exactly so they can fix it and get unbanned from asking questions or posting answers? 0:root@SERVER:/root # echo "something" | sed -e 's/^/\t/g' tsomething 0:root@SERVER:/root #    AIX/ksh .. why doesn't it works? I just want to put a "tab" before every line! There has got to be the establishment of a universal auxiliary language.   Does the verb got add more to the context or is it there just for emphasis? Is it even grammatical?  Using Google-Ngrams I found a few similar versions as follow: . For example;   For many from the North, however, it has seemed difficult and there has seemed to be a problem. There has come to be a convolution between this become enmeshed concept of marriage as it exists in the sacred and how it exists in the secular. Most of the time since I have been here, there has appeared to be considerable feeling in the minds of a few. There has had to be some negotiation, obviously, but I think we provided what our soldiers need and what our country needs.   In general, I wanna know if 'have/has'+past-participle+'to be' is grammatical. I accidentally removed my /etc/apt/sources.list file. Is it hosted by Canonical somewhere so I can re-add it to the system? It's a bit of an emergency, so I hope someone can provide a quick answer. latex : Exclude draftwatermark from specific pages I am using draftwatermark package. Is there any option to exclude watermark from some specific pages? Say no watermark from pg 3-4. I can not use xwatermark package. It conflicts with the geometry package of my document.  MWE:  \documentclass[12pt,a4paper]{exam} \usepackage{draftwatermark}  \usepackage{lipsum}   \SetWatermarkAngle{45}  \SetWatermarkLightness{.8}  \SetWatermarkFontSize{10cm}  \SetWatermarkScale{5}  \SetWatermarkText{\tt{12345}}  \begin{document}  \lipsum[1-20]  \end{document} What makes someone deserving of a Ph.D.? Few days back while attending a thesis defense, one Professor was asking the defender why does he think, he deserves the degree. I was wondering since then, is there really any general answer for that? or the answer should be given describing my own work and then emphasis them how it is important for research field?  I asked the question here to know your opinion about it and to list down what could be the possible answers to this question. This is a spin-off question from .   says this on the subject of storage order (clustered index) and the output order     A lot of people believe that a clustered index guarantees a sort order on output. But that's not what it does; it guarantees a storage order on disk.   See, for example, .   I've read the blog post by Hugo Kornelis and understands that an index doesn't guarantee that the sql server reads the records in a specific order. Yet I have a hard time accepting that I can't assume this for my scenario?  CREATE TABLE [dbo].[SensorValues](   [DeviceId] [int] NOT NULL,   [SensorId] [int] NOT NULL,   [SensorValue] [int] NOT NULL,   [Date] [int] NOT NULL, CONSTRAINT [PK_SensorValues] PRIMARY KEY CLUSTERED  (   [DeviceId] ASC,   [SensorId] ASC,   [Date] DESC ) WITH (     FILLFACTOR=75,     DATA_COMPRESSION = PAGE,     PAD_INDEX = OFF,     STATISTICS_NORECOMPUTE = OFF,     SORT_IN_TEMPDB = OFF,     IGNORE_DUP_KEY = OFF,     ONLINE = OFF,     ALLOW_ROW_LOCKS = ON,     ALLOW_PAGE_LOCKS = ON)   ON [MyPartitioningScheme]([Date])   My original query was this:  SELECT TOP 1 SensorValue   FROM SensorValues   WHERE SensorId = 53     AND DeviceId = 3819     AND Date &lt; 1339225010   ORDER BY Date DESC   But I suggest that I could as well use this one (read below for my explanation):  SELECT TOP 1 SensorValue   FROM SensorValues   WHERE SensorId = 53     AND DeviceId = 3819     AND Date &lt; 1339225010   As you can see, my table rows are small (16bytes) and I've got only one index, a clustered. In my scenario, the table consists of 100.000.000 records at this moment (and this will most likely increase tenfold).  When the database server queries this table it has two ways of finding my rows, either it seeks the primary key and thereby reading and returning my values in desc. order of Date, or it has to do a full table scan. My conclusion is that a full table scan on all those records will be way too slow and the database server will therefore always seek the table via its primary key and thereby returning the values sorted by Date DESC